Chandigarh January 21, 2020: The Department of CIL/SAIF, Panjab University, Chandigarh organized a workshop on Small Angle X-ray Scattering (SAXS) and Atomic Force Microscope (AFM), here today which was presided over by Prof. Shankarji Jha, Dean University Instructions, Panjab University, who said that the scientists are God’s favorite people.
Prof. Ganga Ram Chaudhary, Director urged on making the Central Instrumentation
facilities(CIL) the best in the country by making it more user-friendly and also
informed regarding reduction in NMR analysis charges for the students of PU.
Dr. Anil Sharma, convener emphasized the importance of such a workshop where participants get hands-on training on sophisticated high-end instruments.
The workshop focused on two advanced analytical techniques of SAXS and AFM. The role of Application experts Kanika and Dr. Dharmesh from Anton Paar Pvt Ltd was highly instrumental in the dissemination of simple ideas on which these new disciplines are based.
Kanika demonstrated that SAXS is a very powerful analytical nondestructive tool to have insight regarding particle size, shape, crystalline nature, porosity, internal structure, etc. for advanced materials as well as biological samples.
Dr. Dharmesh explained how the AFM can be helpful in visualization and measurement of nanostructures and even structures at the atomic levels in the field of material sciences, life sciences, engineering and numerous other fields.
The Material and Biological Science researchers attended the workshop.